Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9894271 | Pattern inspection apparatus and pattern inspection method | Tatsuhiko Higashiki, Seiji Morita, Takashi Hirano | 2018-02-13 |
RY
Ryoji Yoshikawa
Overall (2018): #253,031 of 503,207Top 55%
1
Patents 2018