Issued Patents 2018
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10113947 | Semiconductor analysis chip and particle inspection method | Kentaro Kobayashi, Hiroshi Hamasaki | 2018-10-30 |
| 9914637 | Electronic device using MEMS technology | Akira Fujimoto, Tamio Ikehashi | 2018-03-13 |
| 9901970 | Formed material manufacturing method | Yudai Yamamoto, Katsuhide Nishio | 2018-02-27 |
| 9895691 | Analysis package for detecting particles in a sample liquid | Hiroshi Hamasaki, Michihiko Nishigaki, Yutaka Onozuka, Kentaro Kobayashi, Hiroko MIKI | 2018-02-20 |
| 9885680 | Analysis package for detecting particles in a sample liquid including an analysis chip mounted on a package board | Hiroshi Hamasaki, Michihiko Nishigaki, Yutaka Onozuka, Kentaro Kobayashi, Hiroko MIKI | 2018-02-06 |