Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10113947 | Semiconductor analysis chip and particle inspection method | Kentaro Kobayashi, Naofumi Nakamura | 2018-10-30 |
| 9895691 | Analysis package for detecting particles in a sample liquid | Michihiko Nishigaki, Yutaka Onozuka, Kentaro Kobayashi, Hiroko MIKI, Naofumi Nakamura | 2018-02-20 |
| 9885680 | Analysis package for detecting particles in a sample liquid including an analysis chip mounted on a package board | Michihiko Nishigaki, Yutaka Onozuka, Kentaro Kobayashi, Hiroko MIKI, Naofumi Nakamura | 2018-02-06 |