YW

You-Jin Wang

HM Hermes Microvision: 1 patents #14 of 18Top 80%
Overall (2018): #180,515 of 503,207Top 40%
1
Patents 2018

Issued Patents 2018

Patent #TitleCo-InventorsDate
10054556 Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask Chiyan Kuan, Chung-Shih Pan 2018-08-21