Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2018-03-13 |
YW
Yakov Weinberg
Overall (2018): #186,694 of 503,207Top 40%
1
Patents 2018