Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10114039 | Selectively geometric shaped contact pin for electronic component testing and method of fabrication | David A. Johnson, Neil Anthony Graf, Kenna Pretts | 2018-10-30 |
| 10067164 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Dan Campion, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more | 2018-09-04 |