Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10078101 | Wafer level integrated circuit probe array and method of construction | Jathan D. Edwards, Charles Marks | 2018-09-18 |
| 10067164 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey C. Sherry +1 more | 2018-09-04 |