JL

James P. Levin

TC Toppan Printing Co.: 2 patents #11 of 111Top 10%
IBM: 2 patents #3,188 of 10,623Top 35%
📍 South Burlington, VT: #34 of 130 inventorsTop 30%
🗺 Vermont: #123 of 510 inventorsTop 25%
Overall (2018): #140,210 of 503,207Top 30%
2
Patents 2018

Issued Patents 2018

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9996000 Test pattern layout for test photomask and method for evaluating critical dimension changes Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, Joseph L. Malenfant, Jr., Steven C. Nash 2018-06-12
9989843 Test pattern layout for test photomask and method for evaluating critical dimension changes Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, Joseph L. Malenfant, Jr., Steven C. Nash 2018-06-05