Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9996000 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, James P. Levin, Steven C. Nash | 2018-06-12 |
| 9989843 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, James P. Levin, Steven C. Nash | 2018-06-05 |