Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10066936 | Test structures and metrology technique utilizing the test structures for measuring in patterned structures | — | 2018-09-04 |
| 9915624 | Optical metrology for in-situ measurements | Cornel Bozdog, Dario Elyasi | 2018-03-13 |