Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10109574 | Structure and method for improving high voltage breakdown reliability of a microelectronic device | Jeffrey Alan West, Byron Lovell Williams, Weidong Tian | 2018-10-23 |
| 9893008 | High voltage polymer dielectric capacitor isolation device | Thomas D. Bonifield, Byron Lovell Williams, Shrinivasan Jaganathan, Dhaval A. Saraiya | 2018-02-13 |