Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10147784 | High voltage galvanic isolation device | Thomas D. Bonifield, Byron Lovell Williams | 2018-12-04 |
| 10109574 | Structure and method for improving high voltage breakdown reliability of a microelectronic device | Byron Lovell Williams, David Leonard Larkin, Weidong Tian | 2018-10-23 |
| 10109597 | Crack deflector structure for improving semiconductor device robustness against saw-induced damage | Thomas D. Bonifield, Basab Chatterjee | 2018-10-23 |
| 10008450 | Oxidation resistant barrier metal process for semiconductor devices | Kezhakkedath R. Udayakumar, Eric H. Warninghoff, Alan G. Merriam, Rick A. Faust | 2018-06-26 |