Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157727 | Aberration measurement in a charged particle microscope | Peter Christiaan Tiemeijer | 2018-12-18 |
| 9978561 | Post column filter with enhanced energy range | Peter Christiaan Tiemeijer | 2018-05-22 |