Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10088518 | Apparatus and method for classifying and locating electrical faults in circuitry | Zhiguo Qian, Jong-Ru Guo, Zhichao Zhang, Zuoguo Wu | 2018-10-02 |
| 10026664 | Apparatus and method to monitor die edge defects | Zhiyong Wang, Yuan-Chuan Steven Chen | 2018-07-17 |