Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10126355 | Semiconductor probe test card with integrated hall measurement features | Clemens Ostermaier, Gerhard Raczynski, David Kammerlander, Gerhard Prechtl | 2018-11-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10126355 | Semiconductor probe test card with integrated hall measurement features | Clemens Ostermaier, Gerhard Raczynski, David Kammerlander, Gerhard Prechtl | 2018-11-13 |