Issued Patents 2018
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10126355 | Semiconductor probe test card with integrated hall measurement features | Juergen Bostjancic, Gerhard Raczynski, David Kammerlander, Gerhard Prechtl | 2018-11-13 |
| 10128133 | Method of conditioning an etch chamber for contaminant free etching of a semiconductor device | Andreas Haghofer | 2018-11-13 |
| 10090406 | Non-planar normally off compound semiconductor device | Gerhard Prechtl, Oliver Haeberlen | 2018-10-02 |
| 10038051 | Vertical potential short in the periphery region of a III-nitride stack for preventing lateral leakage | Gerhard Prechtl, Oliver Häberlen | 2018-07-31 |
| 10038085 | High electron mobility transistor with carrier injection mitigation gate structure | Gilberto Curatola, Oliver Haeberlen, Gerhard Prechtl | 2018-07-31 |
| 9947600 | Semiconductor structure having a test structure formed in a group III nitride layer | Franz Heider, Bernhard Brunner | 2018-04-17 |