Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10061209 | Method for verifying a pattern of features printed by a lithography process | Julien Mailfert, Sandip Halder | 2018-08-28 |
| 9983154 | Method for inspecting a pattern of features on a semiconductor die | Sandip Halder | 2018-05-29 |
| 9874821 | Method for hotspot detection and ranking of a lithographic mask | Sandip Halder, Dieter Van Den Heuvel, Vincent Truffert | 2018-01-23 |