JM

Julien Mailfert

IV Imec Vzw: 2 patents #12 of 173Top 7%
KR Katholieke Universiteit Leuven, Ku Leuven R&D: 2 patents #1 of 93Top 2%
📍 Leuven, NJ: #1 of 1 inventorsTop 100%
Overall (2018): #132,721 of 503,207Top 30%
2
Patents 2018

Issued Patents 2018

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10061209 Method for verifying a pattern of features printed by a lithography process Philippe Leray, Sandip Halder 2018-08-28
9885949 Method for designing a lithographic mask Werner Gillijns 2018-02-06