Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10024914 | Diagnosing failure locations of an integrated circuit with logic built-in self-test | Steven M. Douskey, Amanda R. Kaufer | 2018-07-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10024914 | Diagnosing failure locations of an integrated circuit with logic built-in self-test | Steven M. Douskey, Amanda R. Kaufer | 2018-07-17 |