Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10163526 | Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing | Eric D. Hunt-Schroeder, Darren L. Anand | 2018-12-25 |
| 10127970 | Voltage boost circuit | Dale E. Pontius | 2018-11-13 |
| 10026494 | Word line voltage generator for calculating optimum word line voltage level for programmable memory array | Eric D. Hunt-Schroeder | 2018-07-17 |
| 10020047 | Static random access memory (SRAM) write assist circuit with improved boost | Eric D. Hunt-Schroeder, Mark D. Jacunski | 2018-07-10 |
| 9953727 | Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing | Eric D. Hunt-Schroeder, Darren L. Anand | 2018-04-24 |
| 9882376 | Electrostatic discharge power clamp with fail-safe design | Robert J. Gauthier, Jr., Junjun Li | 2018-01-30 |
| 9871523 | High speed level translator | — | 2018-01-16 |