Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10163526 | Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing | John A. Fifield, Eric D. Hunt-Schroeder | 2018-12-25 |
| 10062445 | Parallel programming of one time programmable memory array for reduced test time | Eric D. Hunt-Schroeder, Steven H. Lamphier | 2018-08-28 |
| 9953727 | Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing | John A. Fifield, Eric D. Hunt-Schroeder | 2018-04-24 |