Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10084437 | Power supply noise sensor | Dat T. Tran, Anis M. Jarrar, Jorge Arturo Corso, LeRoy Winemberg, Balaji Rajasekaran | 2018-09-25 |
| 9939486 | Integrated time dependent dielectric breakdown reliability testing | Dirk Pfeiffer, Thomas M. Shaw, Peilin Song, Franco Stellari | 2018-04-10 |
| 9874601 | Integrated time dependent dielectric breakdown reliability testing | Dirk Pfeiffer, Thomas M. Shaw, Peilin Song, Franco Stellari | 2018-01-23 |