Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157338 | Graphene-based micro-scale identification system | Alberto Valdes Garcia, Fengnian Xia | 2018-12-18 |
| 9939486 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Thomas M. Shaw, Peilin Song, Franco Stellari | 2018-04-10 |
| 9874601 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Thomas M. Shaw, Peilin Song, Franco Stellari | 2018-01-23 |