Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10024910 | Iterative N-detect based logic diagnostic technique | Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2018-07-17 |
| 9857422 | Methods and systems for generating functional test patterns for manufacture test | John D. Parker, Gerard M. Salem | 2018-01-02 |