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Maki Tanaka

HHHitachi High-Technologies: 1 patents #105 of 409Top 30%
Overall (2018): #311,351 of 503,207Top 65%
1 Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9859093 Method of improving quality of scanning charged particle microscope image, and scanning charged particle microscope apparatus Kenji Nakahira 2018-01-02

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