Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9859093 | Method of improving quality of scanning charged particle microscope image, and scanning charged particle microscope apparatus | Maki Tanaka | 2018-01-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9859093 | Method of improving quality of scanning charged particle microscope image, and scanning charged particle microscope apparatus | Maki Tanaka | 2018-01-02 |