Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10141157 | Method for adjusting height of sample and observation system | Makoto Nakabayashi, Shinsuke Kawanishi | 2018-11-27 |
| 10134564 | Charged particle beam device | Taiga Okumura, Takashi Ohshima, Minami Shouji, Akiko Hisada, Akio Yoneyama | 2018-11-20 |
| 9875877 | Electron scanning microscope and image generation method | Shinsuke Kawanishi | 2018-01-23 |