Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157724 | Electron scanning microscope and image generation method | Yusuke Ominami | 2018-12-18 |
| 10141157 | Method for adjusting height of sample and observation system | Makoto Nakabayashi, Yuusuke OOMINAMI | 2018-11-27 |
| 9875877 | Electron scanning microscope and image generation method | Yuusuke OOMINAMI | 2018-01-23 |