Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10074511 | Defect image classification apparatus | Takehiro Hirai, Yohei Minekawa | 2018-09-11 |
| 9881365 | Semiconductor defect categorization device and program for semiconductor defect categorization device | — | 2018-01-30 |