Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10074511 | Defect image classification apparatus | Yohei Minekawa, Yutaka Tandai | 2018-09-11 |
| 9922414 | Defect inspection method and defect inspection device | Yuji Takagi, Minoru Harada, Masashi Sakamoto | 2018-03-20 |