Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9976966 | Defect inspection method and its device | Yukihiro Shibata, Kei Shimura, Sachio Uto | 2018-05-22 |
| 9865046 | Defect inspection method and defect inspection device | Takahiro Urano | 2018-01-09 |