Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10113959 | Terahertz wave generating device and spectroscopic device using same | Kenji Aiko | 2018-10-30 |
| 9976966 | Defect inspection method and its device | Yukihiro Shibata, Sachio Uto, Toshifumi Honda | 2018-05-22 |