Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056306 | Test structure for monitoring interface delamination | Edward C. Cooney, III, Gary L. Milo, Thomas Warren Weeks, Jr., Patrick S. Spinney, Brian P. Conchieri +2 more | 2018-08-21 |
| 9954137 | Photodetector and methods of manufacture | John J. Ellis-Monaghan, Marwan H. Khater, Edward W. Kiewra, Steven M. Shank | 2018-04-24 |
| 9882081 | Photodetector methods and photodetector structures | John J. Ellis-Monaghan, Marwan H. Khater, Edward W. Kiewra, Steven M. Shank | 2018-01-30 |