AV

Albert Visscher

FE Fei: 1 patents #23 of 107Top 25%
Overall (2018): #492,010 of 503,207Top 100%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9875879 Charged particle microscope with vibration detection / correction Jeroen De Boeij, Johannes Antonius Maria van den Oetelaar 2018-01-23