JB

Jeroen De Boeij

FE Fei: 1 patents #23 of 107Top 25%
📍 's-Hertogenbosch, NL: #15 of 40 inventorsTop 40%
Overall (2018): #377,663 of 503,207Top 80%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9875879 Charged particle microscope with vibration detection / correction Johannes Antonius Maria van den Oetelaar, Albert Visscher 2018-01-23