Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10119990 | Scanning probe microscope and method for examining a surface with a high aspect ratio | Klaus Edinger | 2018-11-06 |
| 9995764 | Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope | Hans Hermann Pieper, Rainer Fettig | 2018-06-12 |