Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10055535 | Method, system and program product for identifying anomalies in integrated circuit design layouts | Piyush Pathak, Wei-Long Wang, Karthik Krishnamoorthy, Fadi Batarseh, Uwe Schroeder +1 more | 2018-08-21 |
| 9859100 | Method and system for dimensional uniformity using charged particle beam lithography | Akira Fujimura, Kazuyuki Hagiwara | 2018-01-02 |