Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056228 | Charged particle beam specimen inspection system and method for operation thereof | Michal Avinun-Kalish, Stefan Lanio | 2018-08-21 |
GE
Gilad Erel
Overall (2018): #411,609 of 503,207Top 85%
1
Patents 2018