DL

Daniel Lam

AD Advantest: 3 patents #4 of 61Top 7%
Overall (2018): #78,849 of 503,207Top 20%
3
Patents 2018

Issued Patents 2018

Patent #TitleCo-InventorsDate
10114067 Integrated waveguide structure and socket structure for millimeter waveband testing Don Lee, Roger McAleenan, Kosuke Miyao 2018-10-30
9921244 Production-level modularized load board produced using a general universal device interface for automatic test equipment for semiconductor testing 2018-03-20
9921266 General universal device interface for automatic test equipment for semiconductor testing 2018-03-20