Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9615803 | System and method for determining X-ray exposure parameters | Yun Zou, Rowland Frederick Saunders, Scott Stephen Zelakiewicz, Floribertus P. M. Heukensfeldt Jansen, Mark Alan Frontera +1 more | 2017-04-11 |