Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9684014 | Prober for inspecting semiconductor devices formed on semiconductor wafer | Kazuya Yano, Isamu Inomata | 2017-06-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9684014 | Prober for inspecting semiconductor devices formed on semiconductor wafer | Kazuya Yano, Isamu Inomata | 2017-06-20 |