Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D794691 | Drilling tool | — | 2017-08-15 |
| 9707629 | Cutting tool | Yoshinori Tanigawa, Yoshikazu Yamashita, Hiroyuki Shimada, Kazuo Nakamae | 2017-07-18 |
| 9684014 | Prober for inspecting semiconductor devices formed on semiconductor wafer | Shuji Akiyama, Isamu Inomata | 2017-06-20 |