Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9811450 | Semiconductor test apparatus for controlling tester | Yukikazu Matsuo, Yasuyuki Tanaka, Kyosaku Nobunaga | 2017-11-07 |
| 9805945 | Etching method | Akira Hidaka, Soichiro Kimura | 2017-10-31 |
| 9557384 | Testing device | Yukikazu Matsuo, Makoto Nishigaki | 2017-01-31 |