Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9811450 | Semiconductor test apparatus for controlling tester | Yasuyuki Tanaka, Masaru Sugimoto, Kyosaku Nobunaga | 2017-11-07 |
| 9557384 | Testing device | Makoto Nishigaki, Masaru Sugimoto | 2017-01-31 |