Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835570 | X-ray diffraction (XRD) characterization methods for sigma=3 twin defects in cubic semiconductor (100) wafers | Yeonjoon Park, Hyun Jung Kim, Jonathan R. Skuza, Kunik Lee, Sang H. Choi | 2017-12-05 |
| 9614026 | High mobility transport layer structures for rhombohedral Si/Ge/SiGe devices | Sang H. Choi, Yeonjoon Park, Hyun Jung Kim, Kunik Lee | 2017-04-04 |