Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835570 | X-ray diffraction (XRD) characterization methods for sigma=3 twin defects in cubic semiconductor (100) wafers | Yeonjoon Park, Hyun Jung Kim, Kunik Lee, Glen C. King, Sang H. Choi | 2017-12-05 |