Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9772372 | Kill die subroutine at probe for reducing parametric failing devices at package test | Soh Ying Seah | 2017-09-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9772372 | Kill die subroutine at probe for reducing parametric failing devices at package test | Soh Ying Seah | 2017-09-26 |