Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9627280 | Methods for probing semiconductor fins through four-point probe and determining carrier concentrations | Clement Hsingjen Wann, Yasutoshi Okuno, Ling-Yen Yeh, Chi-Yuan Shih, Wei-Chun Tsai | 2017-04-18 |