Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9748150 | Test line structure and method for performing wafer acceptance test | Yueh-Chuan Lee, Chia-Chan Chen | 2017-08-29 |
PC
Ping-Chieh Chin
Overall (2017): #278,586 of 506,227Top 60%
1
Patents 2017