Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9689805 | Systems and methods eliminating false defect detections | Biow Hiem Ong, Chien-Hung Lai, Jong-Yuh Chang, Kuang-Yu Liu | 2017-06-27 |
| 9671685 | Lithographic plane check for mask processing | Chin-Hsiang Lin, Heng-Jen Lee, I-Hsiung Huang, Chun-Jen Chen, Rick Lai | 2017-06-06 |
| 9581894 | Image mask film scheme and method | Chun-Lang Chen, Jong-Yuh Chang, Boming Hsu, Tran-Hui Shen | 2017-02-28 |